# Source/Drain Engineered Charge-Plasma Junctionless Transistor for the Immune of Line Edge Roughness Effect

> Research article (IEEE Transactions on Electron Devices, 2018) · cited 11× · AI/ML

**Wikidata**: [openalex:W2791867519](https://www.wikidata.org/wiki/openalex:W2791867519)  
**Source**: https://4ort.xyz/entity/source-drain-engineered-charge-plasma-junctionless-transistor-for-the-immune-of-line-edge-roughness-effect