# Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage Bias Technique

> Research article (Proceedings of the 54th Annual Design Automation Conference 2017, 2017) · cited 24× · AI/ML

**Wikidata**: [openalex:W2624863671](https://www.wikidata.org/wiki/openalex:W2624863671)  
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