# Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images

> Research article (Journal of Applied Physics, 2018) · cited 14× · AI/ML

**Wikidata**: [openalex:W2899037793](https://www.wikidata.org/wiki/openalex:W2899037793)  
**Source**: https://4ort.xyz/entity/simultaneous-scanning-ion-conductance-and-atomic-force-microscopy-with-a-nanopore-effect-of-the-aperture-edge-on-the-ion