# Silicon Wafer Map Defect Classification Using Deep Convolutional Neural Network With Data Augmentation

> Research article (2019 IEEE 5th International Conference on Computer and Communications (ICCC), 2019) · cited 20× · AI/ML

**Wikidata**: [openalex:W3015938507](https://www.wikidata.org/wiki/openalex:W3015938507)  
**Source**: https://4ort.xyz/entity/silicon-wafer-map-defect-classification-using-deep-convolutional-neural-network-with-data-augmentation