# Sensitivity enhancement of the high-resolution xMT multi-trigger resist for EUV lithography

> Research article (Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, 2017) · cited 17× · AI/ML

**Wikidata**: [openalex:W2603342278](https://www.wikidata.org/wiki/openalex:W2603342278)  
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