# Semiconductor Wafer Defect Classification Using Support Vector Machine with Weighted Dynamic Time Warping Kernel Function

> Research article (Industrial Engineering & Management Systems, 2017) · cited 14× · AI/ML

**Wikidata**: [openalex:W2767283061](https://www.wikidata.org/wiki/openalex:W2767283061)  
**Source**: https://4ort.xyz/entity/semiconductor-wafer-defect-classification-using-support-vector-machine-with-weighted-dynamic-time-warping-kernel-functio