# Semi-supervised Wafer Map Pattern Recognition using Domain-Specific Data Augmentation and Contrastive Learning

> Research article (2021 IEEE International Test Conference (ITC), 2021) · cited 15× · AI/ML

**Wikidata**: [openalex:W3216050267](https://www.wikidata.org/wiki/openalex:W3216050267)  
**Source**: https://4ort.xyz/entity/semi-supervised-wafer-map-pattern-recognition-using-domain-specific-data-augmentation-and-contrastive-learning