# Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2023) · cited 19× · AI/ML

**Wikidata**: [openalex:W4362513508](https://www.wikidata.org/wiki/openalex:W4362513508)  
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