# Semantic Segmentation-Based Wafer Map Mixed-Type Defect Pattern Recognition

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2023) · cited 26× · AI/ML

**Wikidata**: [openalex:W4376456922](https://www.wikidata.org/wiki/openalex:W4376456922)  
**Source**: https://4ort.xyz/entity/semantic-segmentation-based-wafer-map-mixed-type-defect-pattern-recognition