# Self-Selection RRAM Cell With Sub- $\mu \text{A}$ Switching Current and Robust Reliability Fabricated by High- $K$ /Metal Gate CMOS Compatible Technology

> Research article (IEEE Transactions on Electron Devices, 2016) · cited 17× · AI/ML

**Wikidata**: [openalex:W2528224264](https://www.wikidata.org/wiki/openalex:W2528224264)  
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