# Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach

> Research article (IEEE Transactions on Device and Materials Reliability, 2021) · cited 15× · AI/ML

**Wikidata**: [openalex:W3201062661](https://www.wikidata.org/wiki/openalex:W3201062661)  
**Source**: https://4ort.xyz/entity/self-heating-and-reliability-aware-intrinsic-safe-operating-area-of-wide-bandgap-semiconductorsan-analytical-approach