# Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

> Research article (2015 IEEE 24th Asian Test Symposium (ATS), 2015) · cited 26× · AI/ML

**Wikidata**: [openalex:W2296084212](https://www.wikidata.org/wiki/openalex:W2296084212)  
**Source**: https://4ort.xyz/entity/scan-chain-reordering-aware-x-filling-and-stitching-for-scan-shift-power-reduction
