# Scan chain encryption for the test, diagnosis and debug of secure circuits

> Research article (2017 22nd IEEE European Test Symposium (ETS), 2017) · cited 34× · AI/ML

**Wikidata**: [openalex:W2735315321](https://www.wikidata.org/wiki/openalex:W2735315321)  
**Source**: https://4ort.xyz/entity/scan-chain-encryption-for-the-test-diagnosis-and-debug-of-secure-circuits