# Sample rotation improves gas cluster sputter depth profiling of polymers

> Research article (Surface and Interface Analysis, 2017) · cited 15× · AI/ML

**Wikidata**: [openalex:W2618263371](https://www.wikidata.org/wiki/openalex:W2618263371)  
**Source**: https://4ort.xyz/entity/sample-rotation-improves-gas-cluster-sputter-depth-profiling-of-polymers