# Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses

> Research article (Quality and Reliability Engineering International, 2020) · cited 21× · AI/ML

**Wikidata**: [openalex:W3027141429](https://www.wikidata.org/wiki/openalex:W3027141429)  
**Source**: https://4ort.xyz/entity/robust-inference-for-oneshot-device-testing-data-under-exponential-lifetime-model-with-multiple-stresses