# Robust inference for nondestructive one‐shot device testing under step‐stress model with exponential lifetimes

> Research article (Quality and Reliability Engineering International, 2023) · cited 16× · AI/ML

**Wikidata**: [openalex:W4321239522](https://www.wikidata.org/wiki/openalex:W4321239522)  
**Source**: https://4ort.xyz/entity/robust-inference-for-nondestructive-oneshot-device-testing-under-stepstress-model-with-exponential-lifetimes