# Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy

> Research article (Nanotechnology, 2016) · cited 27× · AI/ML

**Wikidata**: [openalex:W2236221382](https://www.wikidata.org/wiki/openalex:W2236221382)  
**Source**: https://4ort.xyz/entity/robust-high-resolution-imaging-and-quantitative-force-measurement-with-tuned-oscillator-atomic-force-microscopy