# Robust Deep Learning for IC Test Problems

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021) · cited 16× · AI/ML

**Wikidata**: [openalex:W3122610987](https://www.wikidata.org/wiki/openalex:W3122610987)  
**Source**: https://4ort.xyz/entity/robust-deep-learning-for-ic-test-problems