# Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution

> Research article (Microelectronics Reliability, 2020) · cited 10× · AI/ML

**Wikidata**: [openalex:W3042194639](https://www.wikidata.org/wiki/openalex:W3042194639)  
**Source**: https://4ort.xyz/entity/research-on-3d-tlc-nand-flash-reliability-from-the-perspective-of-threshold-voltage-distribution