# Remaining useful life (RUL) regression using Long–Short Term Memory (LSTM) networks

> Research article (Microelectronics Reliability, 2022) · cited 37× · AI/ML

**Wikidata**: [openalex:W4298130363](https://www.wikidata.org/wiki/openalex:W4298130363)  
**Source**: https://4ort.xyz/entity/remaining-useful-life-rul-regression-using-longshort-term-memory-lstm-networks