# Reliability vs. security: Challenges and opportunities for developing reliable and secure integrated circuits

> Research article (2016 IEEE International Reliability Physics Symposium (IRPS), 2016) · cited 17× · AI/ML

**Wikidata**: [openalex:W2527250456](https://www.wikidata.org/wiki/openalex:W2527250456)  
**Source**: https://4ort.xyz/entity/reliability-vs-security-challenges-and-opportunities-for-developing-reliable-and-secure-integrated-circuits