# Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited)

> Research article (2022 IEEE International Reliability Physics Symposium (IRPS), 2022) · cited 11× · AI/ML

**Wikidata**: [openalex:W4225293071](https://www.wikidata.org/wiki/openalex:W4225293071)  
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