# Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV

> Research article (IEEE Transactions on Circuits and Systems I Regular Papers, 2017) · cited 41× · AI/ML

**Wikidata**: [openalex:W2729749234](https://www.wikidata.org/wiki/openalex:W2729749234)  
**Source**: https://4ort.xyz/entity/reliability-in-super-and-near-threshold-computing-a-unified-model-of-rtn-bti-and-pv