# Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle

> Research article (IEEE Access, 2020) · cited 14× · AI/ML

**Wikidata**: [openalex:W3094030362](https://www.wikidata.org/wiki/openalex:W3094030362)  
**Source**: https://4ort.xyz/entity/reliability-evaluation-of-multi-mechanism-failure-for-semiconductor-devices-using-physics-of-failure-technique-and-maxim