# Reliability characterization of SiON and MGHK MOSFETs using flicker noise and its correlation with the bias temperature instability

> Research article (Solid-State Electronics, 2017) · cited 13× · AI/ML

**Wikidata**: [openalex:W2625076853](https://www.wikidata.org/wiki/openalex:W2625076853)  
**Source**: https://4ort.xyz/entity/reliability-characterization-of-sion-and-mghk-mosfets-using-flicker-noise-and-its-correlation-with-the-bias-temperature-