# Reliability Analysis of Two Resolver Configurations Under Faulty Conditions in 2DOF System

> Research article (IEEE Transactions on Instrumentation and Measurement, 2022) · cited 15× · AI/ML

**Wikidata**: [openalex:W4312776558](https://www.wikidata.org/wiki/openalex:W4312776558)  
**Source**: https://4ort.xyz/entity/reliability-analysis-of-two-resolver-configurations-under-faulty-conditions-in-2dof-system
