# Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs

> Research article (IEEE Transactions on Electron Devices, 2022) · cited 10× · AI/ML

**Wikidata**: [openalex:W4313396530](https://www.wikidata.org/wiki/openalex:W4313396530)  
**Source**: https://4ort.xyz/entity/refined-dc-and-low-frequency-noise-characterization-at-room-and-cryogenic-temperatures-of-vertically-stacked-silicon-nan