# Recognition of unknown wafer defect via optimal bin embedding technique

> Research article (The International Journal of Advanced Manufacturing Technology, 2022) · cited 12× · AI/ML

**Wikidata**: [openalex:W4283373853](https://www.wikidata.org/wiki/openalex:W4283373853)  
**Source**: https://4ort.xyz/entity/recognition-of-unknown-wafer-defect-via-optimal-bin-embedding-technique