# Recognition and Location of Mixed-type Patterns in Wafer Bin Maps

> Research article (2019 IEEE International Conference on Smart Manufacturing, Industrial & Logistics Engineering (SMILE), 2019) · cited 25× · AI/ML

**Wikidata**: [openalex:W3000953789](https://www.wikidata.org/wiki/openalex:W3000953789)  
**Source**: https://4ort.xyz/entity/recognition-and-location-of-mixed-type-patterns-in-wafer-bin-maps