# Read Static Noise Margin Decrease of 65-nm 6-T SRAM Cell Induced by Total Ionizing Dose

> Research article (IEEE Transactions on Nuclear Science, 2017) · cited 15× · AI/ML

**Wikidata**: [openalex:W2780870700](https://www.wikidata.org/wiki/openalex:W2780870700)  
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