# Random telegraph noise: The key to single defect studies in nano-devices

> Research article (Thin Solid Films, 2015) · cited 13× · AI/ML

**Wikidata**: [openalex:W1779288594](https://www.wikidata.org/wiki/openalex:W1779288594)  
**Source**: https://4ort.xyz/entity/random-telegraph-noise-the-key-to-single-defect-studies-in-nano-devices