# Random telegraph noise measurement and analysis based on arrayed test circuit toward high S/N CMOS image sensors

> Research article (2016 International Conference on Microelectronic Test Structures (ICMTS), 2016) · cited 14× · AI/ML

**Wikidata**: [openalex:W2401975983](https://www.wikidata.org/wiki/openalex:W2401975983)  
**Source**: https://4ort.xyz/entity/random-telegraph-noise-measurement-and-analysis-based-on-arrayed-test-circuit-toward-high-s-n-cmos-image-sensors