# Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability

> Research article (2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2016) · cited 19× · AI/ML

**Wikidata**: [openalex:W2516030650](https://www.wikidata.org/wiki/openalex:W2516030650)  
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