# Probing magnetic properties of STT-MRAM devices down to sub-20 nm using spin-torque FMR

> Research article (2017 IEEE International Electron Devices Meeting (IEDM), 2017) · cited 15× · AI/ML

**Wikidata**: [openalex:W2787655546](https://www.wikidata.org/wiki/openalex:W2787655546)  
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