# Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET

> Research article (IEEE Access, 2021) · cited 18× · AI/ML

**Wikidata**: [openalex:W3172099631](https://www.wikidata.org/wiki/openalex:W3172099631)  
**Source**: https://4ort.xyz/entity/probabilistic-artificial-neural-network-for-line-edge-roughness-induced-random-variation-in-finfet