# Probabilistic analysis of dynamic and temporal fault trees using accurate stochastic logic gates

> Research article (Microelectronics Reliability, 2015) · cited 14× · AI/ML

**Wikidata**: [openalex:W1026309181](https://www.wikidata.org/wiki/openalex:W1026309181)  
**Source**: https://4ort.xyz/entity/probabilistic-analysis-of-dynamic-and-temporal-fault-trees-using-accurate-stochastic-logic-gates