# Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction

> Research article (Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, 2018) · cited 10× · AI/ML

**Wikidata**: [openalex:W2787891218](https://www.wikidata.org/wiki/openalex:W2787891218)  
**Source**: https://4ort.xyz/entity/principal-component-analysis-image-fusion-of-tof-sims-and-microscopic-images-and-low-intensity-secondary-ion-enhancement