# Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond

> Research article (2015 IEEE International Electron Devices Meeting (IEDM), 2015) · cited 38× · AI/ML

**Wikidata**: [openalex:W2288338221](https://www.wikidata.org/wiki/openalex:W2288338221)  
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