# Prediction of Induced Voltages on Ports in Complex, Three-Dimensional Enclosures With Apertures, Using the Random Coupling Model

> Research article (IEEE Transactions on Electromagnetic Compatibility, 2016) · cited 24× · AI/ML

**Wikidata**: [openalex:W2473584207](https://www.wikidata.org/wiki/openalex:W2473584207)  
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