# Predicting SiC MOSFET Behavior Under Hard-Switching, Soft-Switching, and False Turn-On Conditions

> Research article (IEEE Transactions on Industrial Electronics, 2017) · cited 223× · AI/ML

**Wikidata**: [openalex:W2736749564](https://www.wikidata.org/wiki/openalex:W2736749564)  
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