# Power Optimization of VLSI Scan under Test using X-Filling Technique

> Research article (2021 Emerging Trends in Industry 4.0 (ETI 4.0), 2021) · cited 12× · AI/ML

**Wikidata**: [openalex:W4205203814](https://www.wikidata.org/wiki/openalex:W4205203814)  
**Source**: https://4ort.xyz/entity/power-optimization-of-vlsi-scan-under-test-using-x-filling-technique