# Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems

> Research article (Journal of Analytical Atomic Spectrometry, 2020) · cited 11× · AI/ML

**Wikidata**: [openalex:W3092379578](https://www.wikidata.org/wiki/openalex:W3092379578)  
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