# Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018) · cited 15× · AI/ML

**Wikidata**: [openalex:W2902445356](https://www.wikidata.org/wiki/openalex:W2902445356)  
**Source**: https://4ort.xyz/entity/post-silicon-gate-level-error-localization-with-effective-and-combined-trace-signal-selection