# Pixel-Level Assessment Model of Contamination Conditions of Composite Insulators Based on Hyperspectral Imaging Technology and a Semi-Supervised Ladder Network

> Research article (IEEE Transactions on Dielectrics and Electrical Insulation, 2022) · cited 30× · AI/ML

**Wikidata**: [openalex:W4312594441](https://www.wikidata.org/wiki/openalex:W4312594441)  
**Source**: https://4ort.xyz/entity/pixel-level-assessment-model-of-contamination-conditions-of-composite-insulators-based-on-hyperspectral-imaging-technolo
