# Parametric Fault Detection in Analog Circuits: A Statistical Approach

> Research article (2016 IEEE 25th Asian Test Symposium (ATS), 2016) · cited 13× · AI/ML

**Wikidata**: [openalex:W2567193607](https://www.wikidata.org/wiki/openalex:W2567193607)  
**Source**: https://4ort.xyz/entity/parametric-fault-detection-in-analog-circuits-a-statistical-approach