# Oxide thickness dependent compact model of channel noise for E-mode AlGaN/GaN MOS-HEMT

> Research article (AEU - International Journal of Electronics and Communications, 2017) · cited 20× · AI/ML

**Wikidata**: [openalex:W2762082833](https://www.wikidata.org/wiki/openalex:W2762082833)  
**Source**: https://4ort.xyz/entity/oxide-thickness-dependent-compact-model-of-channel-noise-for-e-mode-algan-gan-mos-hemt