# Outliers Detection Models in Shewhart Control Charts; an Application in Photolithography: A Semiconductor Manufacturing Industry

> Research article (Mathematics, 2020) · cited 21× · AI/ML

**Wikidata**: [openalex:W3027648376](https://www.wikidata.org/wiki/openalex:W3027648376)  
**Source**: https://4ort.xyz/entity/outliers-detection-models-in-shewhart-control-charts-an-application-in-photolithography-a-semiconductor-manufacturing-in