# Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality

> Research article (IEEE Access, 2023) · cited 16× · AI/ML

**Wikidata**: [openalex:W4388208042](https://www.wikidata.org/wiki/openalex:W4388208042)  
**Source**: https://4ort.xyz/entity/origin-of-low-frequency-noise-in-si-n-mosfet-at-cryogenic-temperatures-the-effect-of-interface-quality