# Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage

> Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2020) · cited 11× · AI/ML

**Wikidata**: [openalex:W2999953543](https://www.wikidata.org/wiki/openalex:W2999953543)  
**Source**: https://4ort.xyz/entity/optimization-of-small-delay-defects-test-quality-by-clock-speed-selection-and-proper-masking-based-on-the-weighted-slack