# On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM

> Research article (2021 IEEE 39th VLSI Test Symposium (VTS), 2021) · cited 24× · AI/ML

**Wikidata**: [openalex:W3167846368](https://www.wikidata.org/wiki/openalex:W3167846368)  
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